Most read articles
REVIEW Q2 2026
Chip industry update: Memory goes on allocation as power demand turns
SIC VS GAN
SiC vs GaN in 2026 and beyond
BASIC KNOWLEDGE - Ohm's law
The meaning of Ohm’s law: Fundamentals at a glance
SEMICONDUCTOR HISTORY
The story of Silicon Valley – How it began, how it boomed, and where it’s headed
POWER TRANSISTOR
EPC Space introduces radiation-hard eGaN FETs for space computing
CIRCUIT PROTECTION
Littelfuse launches TPSMD-FL TVS diodes for simplified load-dump protection
CURRENT SENSING
Bourns introduces CFG-A series wide-terminal metal foil current sense resistors
DC CAPACITOR
TDK adds vibration-resistant axial and soldering-star capacitors for 125 V
Galleries
PCIM ASIA SHENZHEN 2026
International power electronics community comes together in Southern China
SUPPLY CHAIN
GlobalWafers joins SEMI Taiwan materials Alliance
SEMICONDUCTORS
Infineon acquires C2i Semiconductors to expand its innovation capabilities
GRID INFRASTRUCTURE
Hitachi Energy expands grid manufacturing in China
PCIM 2026 - BEST PAPER AWARD
Low-Complexity Sub-Nanosecond Digital Active Gate Driving for IV-Trajectory Control in SiC Modules
This paper presents a low-complexity digital active gate driver, utilizing only two gate resistances with a single resistance changeover per switching event as well as a novel clock-frequency tuning method for sub-nanosecond timing resolution.
PCIM 2026 - BEST PAPER AWARD
Smart Circuit Breaker for Smart Low Voltage DC Power Grids
This paper presents the first industrialized 100 A / 800 V Smart Semiconductor Hybrid Circuit Breaker (SCHCB), utilizing a hybrid switching concept combining a high-speed mechanical arcing switch, a bidirectional power semiconductor switch, a robust voltage clamping circuit, and a mechanical isolation contact system.
PCIM 2026 - YOUNG RESEARCHER AWARD
Novel Test Concept for Active Short-Circuit Characterization
This paper presents a novel and fully bidirectional test concept for active short-circuit (ASC) characterization, utilizing two high-current-rated IGBTs operated in the active region as well as flexible gate-voltage-based current control.
PCIM 2026 - BEST PAPER AWARD
Lifetime of IGBTs Under Mixed Sequential Power Cycling: A Matched-Lifetime Sequencing Experiment
This paper presents a novel matched-lifetime sequencing methodology for power cycling tests, utilizing an AC power cycling test bench as well as a controlled mixed-stress protocol on 1.2 kV/150 A IGBT modules.
Diotec Semiconductor AG
800 V: From Automotive Innovation to AI Infrastructure
MBS - Hodde GmbH & Co. KG
Mains chokes
Greenconn Technology GmbH
Box Headers
MERSEN France SB
Meet us at Innotrans 2026
MEASUREMENT TOOLS
Hioki achieves tenfold advance in high-frequency power calibration
POWER TESTING
Laboratory testing regimens for advanced power design
DATA CENTER
Cadence accelerates digital twin–driven data center AI modernization with HPE