Power cycle testing is the established method to assess IGBT modules’ lifetime. In a highly accelerated test, the end-of-life failure modes are provoked by repetitive DC current pulses. However, in real-life inverter operation a big portion of the power losses is produced by switching events and much smaller current densities are present in the module. Especially the wire bond lifetime depends on the current density and exaggerated test load currents can lead to early wire bond lift-off.